Prediction of the Transmitted Light Through a Nano-Aperture of SNOM Probes

G. Louarn, S. Taleb, and S. Cuenot
Institut des Matériaux Jean Rouxel, Nantes

The knowledge of the light propagation through a nanometer-size aperture is crucial for Scanning Optical Near Field Microscopy (SNOM).

In this work, we address a numerical study of the transmitted electric field through a SNOM probe. The influence of the wavelength is also studied.

Our results show that the logarithmic power decreases linearly as a function of the aperture size, and the energy electric density decreases exponentially with the tip-sample distance, which is explained by the evanescent character of the near field.